i) Find the differences between the AES and XPS in terms of principle and information obtained from the spectra.  ii) Why AFM is mostly utilized microscopic method for the determination of the thickness of the film?

Principles of Instrumental Analysis
7th Edition
ISBN:9781305577213
Author:Douglas A. Skoog, F. James Holler, Stanley R. Crouch
Publisher:Douglas A. Skoog, F. James Holler, Stanley R. Crouch
Chapter21: Surface Characterization By Spectroscopy And Microscopy
Section: Chapter Questions
Problem 21.9QAP
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i) Find the differences between the AES and XPS in terms of principle and information obtained from the spectra. 

ii) Why AFM is mostly utilized microscopic method for the determination of the thickness of the film?

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