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2.A device used to measure the surface temperature of an object to within a spatial resolution of approximately 40 is shown in the schematic. It consists of an extremely sharp- tipped stylus and an extremely small cantilever that is scanned across the surface. The probe tip is of circular cross section and is fabricated of polycrystalline silicon dioxide. The ambient temperature is measured at the pivoted end of the cantilever as. and the device is equipped with a sensor to measure the temperature at the upper end of the sharp tip, . The thermal resistance between the sensing probe and the pivoted end is

2.A device used to measure the surface temperature of an object to within a spatial resolution of approximately 40 is shown in the schematic. It consists of an extremely sharp- tipped stylus and an extremely small cantilever that is scanned across the surface. The probe tip is of circular cross section and is fabricated of polycrystalline silicon dioxide. The ambient temperature is measured at the pivoted end of the cantilever as. and the device is equipped with a sensor to measure the temperature at the upper end of the sharp tip, . The thermal resistance between the sensing probe and the pivoted end is

Introduction to Chemical Engineering Thermodynamics
Introduction to Chemical Engineering Thermodynamics
8th Edition
ISBN:9781259696527
Author:J.M. Smith Termodinamica en ingenieria quimica, Hendrick C Van Ness, Michael Abbott, Mark Swihart
Publisher:J.M. Smith Termodinamica en ingenieria quimica, Hendrick C Van Ness, Michael Abbott, Mark Swihart
Chapter1: Introduction
Section: Chapter Questions
Problem 1.1P
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2.A device used to measure the surface temperature of an object to within a spatial resolution of approximately 40 is shown in the schematic. It consists of an extremely sharp- tipped stylus and an extremely small cantilever that is scanned across the surface. The probe tip is of circular cross section and is fabricated of polycrystalline silicon dioxide. The ambient temperature is measured at the pivoted end of the cantilever as. and the device is equipped with a sensor to measure the temperature at the upper end of the sharp tip, . The thermal resistance between the sensing probe and the pivoted end is (a) Determine the thermal resistance between the surface temperature and the sensing temperature. (b) If the sensing temperature is, determine the surface temperature. Silicon dioxide D=100mm- Air r(x) Tsen = 28.5°C T L = 50 nm
Transcribed Image Text:2.A device used to measure the surface temperature of an object to within a spatial resolution of approximately 40 is shown in the schematic. It consists of an extremely sharp- tipped stylus and an extremely small cantilever that is scanned across the surface. The probe tip is of circular cross section and is fabricated of polycrystalline silicon dioxide. The ambient temperature is measured at the pivoted end of the cantilever as. and the device is equipped with a sensor to measure the temperature at the upper end of the sharp tip, . The thermal resistance between the sensing probe and the pivoted end is (a) Determine the thermal resistance between the surface temperature and the sensing temperature. (b) If the sensing temperature is, determine the surface temperature. Silicon dioxide D=100mm- Air r(x) Tsen = 28.5°C T L = 50 nm
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